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Accuracy of Measurement of Microrelief Dimensions from a Scanning Electron Microscope Image of a Cleavage

โœ Scribed by Ch. P. Volk; Yu. A. Novikov; Yu. V. Ozerin; A. V. Rakov


Book ID
110295515
Publisher
Springer US
Year
2001
Tongue
English
Weight
35 KB
Volume
44
Category
Article
ISSN
0543-1972

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