𝔖 Bobbio Scriptorium
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Accumulation and discharging of the hole charge in oxide layers of MIS structures

✍ Scribed by Anufriev, E. V. ;Gurtov, V. A.


Book ID
105376746
Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
291 KB
Volume
76
Category
Article
ISSN
0031-8965

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We have investigated photoluminescence of double-barrier diodes under various bias voltages and observed the saturation of the broadening of the photoluminescence lines. We have also studied the integrated photoluminescence intensity with increasing applied voltages near resonant voltages for high q