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Absorption in high-energy electron diffraction from non-centrosymmetric crystals

✍ Scribed by Bird, D. M.


Book ID
111656420
Publisher
International Union of Crystallography
Year
1990
Tongue
English
Weight
794 KB
Volume
46
Category
Article
ISSN
0108-7673

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## Abstract The quantitative characterization of complex microdefect structures in silicon crystals grown by Czochralski method and irradiated with various doses of high‐energy electrons (18 MeV) has been performed by methods of the high‐resolution X‐ray diffraction. The concentrations and average