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Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS)

โœ Scribed by Z.L. Wang; R.F. Egerton

Book ID
118362110
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
920 KB
Volume
205
Category
Article
ISSN
0039-6028

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๐Ÿ“œ SIMILAR VOLUMES

Surface microanalysis by reflection elec
Surface microanalysis by reflection electron energy-loss spectroscopy
โœ Wang, Z. L. ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 668 KB

Several basic physical concepts of applying eq. Ik = 1oN"t to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, u is the scattering cross section of element x wi