✦ LIBER ✦

Aberration-corrected TEM : A New Wave of In situ Investigations in Materials Science

✍ Scribed by Bruno Janssens

Publisher: Wiley (John Wiley & Sons)
Year: 2007
Weight: 685 KB
Volume: 9
Category: Article
ISSN: 1439-4243
DOI: 10.1002/imic.200790148

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✦ Synopsis

A chain reaction is building in the world of nano technology and it is rapidly approaching critical mass. New tools and capabilities are enabling new discoveries, which are creating new products, which are generating new demand, which is funding new tool development… We are on the threshold of an explosion in both our fundamental knowledge and its practical applications.

digital control of all operational parameters. Gone are the tedious setup and constant adjustment procedures required by older systems. The same improvements allow fast switching among users, techniques and operating conditions, and automated tuning and analysis procedures with little or no operator intervention.

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