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Ab initio study of the distribution of point defects at grain boundaries in crystalline silicon

✍ Scribed by Lazebnykh, V. Yu.; Mysovsky, A. S.


Book ID
125393115
Publisher
SP MAIK Nauka/Interperiodica
Year
2013
Tongue
English
Weight
445 KB
Volume
98
Category
Article
ISSN
0021-3640

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