A wafer-scale 170000-gate FFT processor with built-in test circuits

✍ Scribed by Yamashita, K.; Kanasugi, A.; Hijiya, S.; Goto, G.; Matsumura, N.; Shirato, T.

• Book ID: 119776084
• Publisher: IEEE
• Year: 1988
• Tongue: English
• Weight: 769 KB
• Volume: 23
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/4.993