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A variational Treatment of the +/− J-model

✍ Scribed by G. Sobotta


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
668 KB
Volume
136
Category
Article
ISSN
0378-4371

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✦ Synopsis


The exponentially degenerated ground state of the + / -J-model is caused by frustrated spins. We present a variational technique, in which the frustrated spins are treated exactly, while the non-frustrated spins are treated as in models with vanishing residual entropy.


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A variational model for transistors
✍ A. Martinez; M. Lozano; J. Barquillas; A. Carlosena 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 417 KB

This paper presents a linear variational model for transistors in their typical amplifying region, valid for BJTs as well as FETs. The model allows one to determine the most important parameters of analog electronic systems: small-signal behaviour, thermal drift and effects of device mismatches.