A valence Auger analysis across the annealed interface between a deposited titanium film and sapphire

✍ Scribed by K Takahashi; H Ishii; Y Takahashi; K Nishiguchi

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 351 KB
• Volume: 216
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(92)90844-2