๐”– Bobbio Scriptorium
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A universal MOSFET mobility degradation model for circuit simulation

โœ Scribed by Yeric, G.M.; Tasch, A.F.; Banerjee, S.K.


Book ID
119778158
Publisher
IEEE
Year
1990
Tongue
English
Weight
381 KB
Volume
9
Category
Article
ISSN
0278-0070

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