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A unified approach to RF and microwave noise parameter modeling in bipolar transistors

โœ Scribed by Niu, G.; Cressler, J.D.; Shiming Zhang; Ansley, W.E.; Webster, C.S.; Harame, D.L.

Book ID
111678782
Publisher
IEEE
Year
2001
Tongue
English
Weight
145 KB
Volume
48
Category
Article
ISSN
0018-9383

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