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A transmission electron microscopy study of intermetallic formation in aluminium-copper thin-film couples

✍ Scribed by K. Rajan; E.R. Wallach

Publisher: Elsevier Science
Year: 1980
Tongue: English
Weight: 468 KB
Volume: 49
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(80)90164-5

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