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A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions

✍ Scribed by Yili Hong; Haiming Ma; Meeker, W.Q.

Book ID: 114668869
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 211 KB
Volume: 59
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.2010.2083252

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## Abstract Accelerated life testing (ALT) is widely used to determine the failure time distribution of a product and the associated life‐stress relationship in order to predict the product's reliability under normal operating conditions. Many types of stress loadings such as constant‐stress, step‐