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A time-of-flight resonance ionization mass spectrometer for elemental analysis of precious metals in minerals

✍ Scribed by Dimov, S. S.; Chryssoulis, S. L.; Lipson, R. H.

Book ID: 121500859
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 379 KB
Volume: 73
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.1518146

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