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A time-of-flight method for studying the properties of an ion cloud stored in an rf trap

✍ Scribed by Earl R. Mosburg Jr.; Michel Vedel; Yves Zerega; Fernande Vedel; Jacques André


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
707 KB
Volume
77
Category
Article
ISSN
0168-1176

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