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A time-of-flight atom-probe field-ion microscope for the study of defects in metals

✍ Scribed by Thomas M. Hall; Alfred Wagner; Arnold S. Berger; David N. Seidman


Book ID
116059288
Publisher
Elsevier Science
Year
1976
Weight
252 KB
Volume
10
Category
Article
ISSN
0036-9748

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