A time-dependent parameter acquisition system for the characterization of MOS transistors and SONOS memory devices

✍ Scribed by Sharma, U.; Booth, R.V.H.; White, M.H.

• Book ID: 114542578
• Publisher: IEEE
• Year: 1989
• Tongue: English
• Weight: 404 KB
• Volume: 38
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.19997