A theoretical study of the electronic structure for twin stacking faults in silicon : Gong Xin Gao, Zheng Qing-Qi, Han Ru-Shan and Yang Wei-Sheng. Solid St. Commun. 62 (2), 65 (1987)

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 121 KB
• Volume: 27
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(87)90870-5