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A theoretical analysis of the thickness dependence of the localization effect on the normal-state resistivities in high-Tc Y1Ba2Cu3O7−δ thin films

✍ Scribed by Tyan, J. H.; Lue, J. T.

Book ID
121851650
Publisher
American Institute of Physics
Year
1992
Tongue
English
Weight
539 KB
Volume
71
Category
Article
ISSN
0021-8979

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