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A test of the anodic electron current on oxide-covered valve metals

✍ Scribed by V. Trifonova; A. Girginov


Book ID
108343185
Publisher
Elsevier Science
Year
1980
Weight
534 KB
Volume
107
Category
Article
ISSN
0022-0728

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Mechanism of growth of the open circuit
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## Abstract The kinetics of growth of the open circuit insulating oxide films on Hf, Ta, Nb, Zr and Al were studies in many salt solutions using potential and capacitance measurements. The effect of salt type and concentration, oxygen concentration, temperature and surface pretreatment on the growt