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A technique for the rigid mounting of crystals in X-ray diffractometry

✍ Scribed by Denne, W. A.

Book ID
114497828
Publisher
International Union of Crystallography
Year
1971
Tongue
English
Weight
602 KB
Volume
4
Category
Article
ISSN
0021-8898

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## Abstract Analytical expressions for coherent and diffuse scattering intensities with account for imperfections in all the crystals of double‐ and triple‐crystal diffractometers (DCD and TCD) have been derived from the generalized dynamical theory of X‐ray scattering in real single crystals which