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Double-crystal X-ray diffractometry in the role of X-ray standing-wave method

✍ Scribed by A. M. Afanas’ev; M. A. Chuev; R. M. Imamov; É. M. Pashaev; S. N. Yakunin; J. Horvat

Book ID: 110129166
Publisher: SP MAIK Nauka/Interperiodica
Year: 2001
Tongue: English
Weight: 62 KB
Volume: 74
Category: Article
ISSN: 0021-3640
DOI: 10.1134/1.1446544

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## Abstract We propose a common description of the full widths at half maximum of X‐ray diffraction peaks obtained in different scans of triple‐crystal diffractometry and as well as for glancing incidence and glancing exit double‐crystal measurements. Calculations are compared with measurements of