A technique for measuring the impurity concentration of silicon-on-sapphire films using C-V plots

✍ Scribed by Eugene R. Worley

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 513 KB
• Volume: 19
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(76)90179-9