A technique for measuring the impurity concentration of silicon-on-sapphire films using C-V plots : Eugene R. Worley. Solid-St. Electron.19, 997u (1976)

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 233 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90124-x