A synchrotron radiation real-time in situ imaging study on the reverse polarity effect in Cu/Sn–9Zn/Cu interconnect during liquid–solid electromigration

✍ Scribed by Huang, M.L.; Zhang, Z.J.; Zhao, N.; Zhou, Q.

• Book ID: 122919855
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 940 KB
• Volume: 68
• Category: Article
• ISSN: 1359-6462
• DOI: 10.1016/j.scriptamat.2013.02.007