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A suggested method for the determination of the charge density in the interfacial layer of a schottky-barrier MIS diode

✍ Scribed by A.N. Daw; A.K. Datta; M.C. Ash

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 109 KB
Volume: 27
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(84)90174-6

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