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A study on the characteristic of parameters by the response surface method in final wafer polishing

โœ Scribed by Eun-Sang Lee; Sung-Chul Hwang; Jung-Taik Lee; Jong-Koo Won


Book ID
107662184
Publisher
Korean Society for Precision Engineering
Year
2009
Tongue
English
Weight
438 KB
Volume
10
Category
Article
ISSN
1229-8557

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