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A study of vacancy-related defects in (Pb,La)(Zr,Ti)O/sub 3/ thin films using positron annihilation

✍ Scribed by Friessnegg, T.; Aggarwal, S.; Nielsen, B.; Ramesh, R.; Keeble, D.J.; Poindexter, E.H.

Book ID: 121316897
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 586 KB
Volume: 47
Category: Article
ISSN: 0885-3010
DOI: 10.1109/58.852074

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