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[IEEE ISAF 1998. Eleventh IEEE International Symposium on Applications of Ferroelectrics - Montreux, Switzerland (24-27 Aug. 1998)] ISAF 1998. Proceedings of the Eleventh IEEE International Symposium on Applications of Ferroelectrics (Cat. No.98CH36245) - An investigation of vacancy-related defects in (Pb,La)(Zr,Ti)O/sub 3/ thin films using positron annihilation

✍ Scribed by Friessnegg, T.; Aggarwal, S.; Nielsen, B.; Ramesh, R.; Keeble, D.J.; Poindexter, E.H.

Book ID: 126664455
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 389 KB
Category: Article
ISBN-13: 9780780349599
DOI: 10.1109/ISAF.1998.786657

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