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A study of microporous SiO2films by perturbed total internal reflection

✍ Scribed by V. M. Zolotarev; A. F. Perveev; T. G. Arkatova; G. A. Muranova

Publisher: Springer US
Year: 1972
Tongue: English
Weight: 446 KB
Volume: 16
Category: Article
ISSN: 0021-9037
DOI: 10.1007/bf00606744

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