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A study of hot-hole injection during programming drain disturb in flash memories

โœ Scribed by Ielmini, D.; Ghetti, A.; Spinelli, A.S.; Visconti, A.


Book ID
114618161
Publisher
IEEE
Year
2006
Tongue
English
Weight
268 KB
Volume
53
Category
Article
ISSN
0018-9383

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