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A study of copper oxide based resistive switching memory by conductive atom force microscope

✍ Scribed by Zhou, Qianfei; Lu, Qian; Zhang, Xin; Song, Yali; Lin, Yin Yin; Wu, Xiaojing

Book ID: 120353206
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 979 KB
Volume: 271
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2013.01.217

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