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A step toward standardization: development of accurate measurements of X-ray absorption and fluorescence

✍ Scribed by Chantler, Christopher T.; Barnea, Zwi; Tran, Chanh Q.; Rae, Nicholas A.; de Jonge, Martin D.

Book ID: 119771535
Publisher: International Union of Crystallography
Year: 2012
Tongue: English
Weight: 609 KB
Volume: 19
Category: Article
ISSN: 0909-0495
DOI: 10.1107/s0909049512039544

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There are important technological and scientific needs for accurate and precise measurements of the weight and thickness of silicone coatings, which are used in wide-ranging applications. X-ray fluorescence (XRF) spectroscopy offers one means of achieving such measurements. Here we show that, as pre