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A Statistical Physics Method of Electronic Device Reliability Testing from Working Data

✍ Scribed by S. Ya. Grodzenskii

Book ID: 111550540
Publisher: Springer US
Year: 2003
Tongue: English
Weight: 16 KB
Volume: 46
Category: Article
ISSN: 0543-1972
DOI: 10.1023/a:1025428415375

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