Small-signal and large-signal modeling o
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F. Giannini; G. Leuzzi; G. Orengo; M. Albertini
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Article
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2001
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John Wiley and Sons
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English
โ 298 KB
Artificial neural networks (ANNs) are presented for the technologyindependent modeling of active devices in MMICs. ANNs trained with S-parameter and DC measurements over the entire bias and frequency operational band are used for the small-signal bias-dependent modeling of a low-noise GaAs HEMT devi