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A Solution to the Accuracy/Robustness Dilemma in Impedance Control

✍ Scribed by Sang Hoon Kang; Maolin Jin; Pyung Hun Chang

Book ID
117924274
Publisher
IEEE
Year
2009
Tongue
English
Weight
568 KB
Volume
14
Category
Article
ISSN
1083-4435

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πŸ“œ SIMILAR VOLUMES

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## Abstract The atomic force microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. An optimal control problem is proposed for the control of AFMs which includes the design of a sample‐profile estimate signal in addition to the set‐point regulation and resolution