A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

✍ Scribed by Shi, Yiwen; Dworak, Jennifer

• Book ID: 120651677
• Publisher: Springer US
• Year: 2013
• Tongue: English
• Weight: 511 KB
• Volume: 29
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-013-5357-0