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A simplified life estimation for LSI plastic package on thermal shock testing : Atsushi Tanaka, Miho Yamaguchi and Kazuhiro Ikemura. Proceedings of the 22nd Symposium on Reliability and Maintainability. Union of Japanese Scientists and Engineers, 1 (June 1992)

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 113 KB
Volume: 33
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(93)90382-9

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