✦ LIBER ✦

A simple nanoindentation-based methodology to assess the strength of brittle thin films

✍ Scribed by Oscar Borrero-López; Mark Hoffman; Avi Bendavid; Phil J. Martin

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 941 KB
Volume: 56
Category: Article
ISSN: 1359-6454
DOI: 10.1016/j.actamat.2007.12.007

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A technique to assess the reliability of

A technique to assess the reliability of the second-order susceptibility determination of thin films

✍ Mikael Siltanen; Martti Kauranen 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 267 KB

We present a detailed description of a new, statistical technique to determine the second-order susceptibility tensor of thin films [M.

A Simple Route to the Synthesis of Pr2O3

A Simple Route to the Synthesis of Pr2O3 High-k Thin Films

✍ R. Lo Nigro; R.G. Toro; G. Malandrino; V. Raineri; I.L. Fragalà 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 272 KB 👁 2 views

A simple immersion method to determine t

A simple immersion method to determine the refractive index of thin silica films

✍ A.M. Kauffman 📂 Article 📅 1967 🏛 Elsevier Science 🌐 English ⚖ 255 KB

A Simple Model of the Magnetoresistance

A Simple Model of the Magnetoresistance Contribution to the Magnetoimpedance Effect in Thin Films

✍ Barandiarán, J. M. ;Kurlyandskaya, G. V. ;Vázquez, M. ;Gutiérrez, J. ;Garcia, D. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 135 KB 👁 2 views

2.8 A statistical approach to the analys

2.8 A statistical approach to the analysis of dielectric breakdown strength of thin insulating films

✍ K. Kristiansen 📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 541 KB

A simple and accurate method to determin

A simple and accurate method to determine the third-order nonlinear susceptibility of thin films

✍ Kenjiro Miyano; Takeshi Nishiwaki; Akihiro Tomioka 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 491 KB