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A simple method for estimating effective Ion source residence time

โœ Scribed by K.S. Griffith; Gregory I. Gellene

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
399 KB
Volume
4
Category
Article
ISSN
1044-0305

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โœฆ Synopsis

A method is presented that uses the well-understood O2/Ax ion-molecule reaction system to determine the effective ion source residence time of a chemical ionization source. The process consists of: (1) defining the kinetic system in terms of reactions, reaction rates, and ionization cross sections; (2) solving the differential equations that describe the time evolu-tion of the kinetic system, and (3) comparing the calculated results to experimentally measured relative ion intensities. These steps are repeated for a variety of 02/Ar sample ratios and inlet pressures. The method leads to a simple relationship between inlet pressure and effective ion source residence time, independent of the 02/Ar sample ratio.

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