๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A simple automatic cassette for X-ray synchrotron topography

โœ Scribed by Buckley-Golder, I. M. ;Tanner, B. K. ;Clark, G. F.

Book ID
114498752
Publisher
International Union of Crystallography
Year
1977
Tongue
English
Weight
633 KB
Volume
10
Category
Article
ISSN
0021-8898

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The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering