Experiments on automating the transmission electron microscope rely on the search for minimum variance. This image parameter gives satisfactory results for automatic focusing, astigmatism correction, and beam alignment. We investigate here the different image descriptors that might also be used; we
A security circuit for the image intensifier on the electron microscope
โ Scribed by Shih, Min-Yi; Hsu, Tung
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 150 KB
- Volume
- 34
- Category
- Article
- ISSN
- 1059-910X
No coin nor oath required. For personal study only.
โฆ Synopsis
security circuit to blank the electron beam so as not to damage the image intensifier accidentally.
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