๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A security circuit for the image intensifier on the electron microscope

โœ Scribed by Shih, Min-Yi; Hsu, Tung


Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
150 KB
Volume
34
Category
Article
ISSN
1059-910X

No coin nor oath required. For personal study only.

โœฆ Synopsis


security circuit to blank the electron beam so as not to damage the image intensifier accidentally.


๐Ÿ“œ SIMILAR VOLUMES


Which image parameter(s) for the automat
โœ Bonnet, N. ;Zinzindohoue, P. ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 573 KB

Experiments on automating the transmission electron microscope rely on the search for minimum variance. This image parameter gives satisfactory results for automatic focusing, astigmatism correction, and beam alignment. We investigate here the different image descriptors that might also be used; we

On the impulse circuit model for the sin
โœ Jaap Hoekstra ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 192 KB

## Abstract In this paper, the impulse circuit model for the singleโ€electron tunnelling (SET) junction is discussed. Starting from wellโ€known results of the soโ€called orthodox theory of single electronics, an equivalent circuit for the singleโ€electron tunnelling junction is โ€˜derivedโ€™ by examining t

A novel alternating current imaging radi
โœ Guang-Feng Zhang; Guo-Wei Lou; Hong Wang ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 173 KB

## Abstract Different from the traditional direct current radiometric imaging, an alternating current (AC) radiometer was presented to be passive millimeterโ€wave imaging with simple and integrated structure for the purpose of security inspection in China. The AC radiometer image interpretation has

A procedure for making phosphor viewing
โœ King, Murray Vernon ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 186 KB

A technique is described for preparing uniform, durable phosphor layers for viewing screens suitable for the transmission electron microscope; a settling procedure is used. The example described here is for a highvoltage instrument, but with adjustment of the coating density, the technique should be