✦ LIBER ✦

A secondary electron emission correction for quantitative Auger yield measurements

✍ Scribed by E.N. Sickafus

Publisher: Elsevier Science
Year: 1980
Weight: 67 KB
Volume: 100
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(80)90182-6

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Calculated Elemental Sputter Yield Corre

Calculated Elemental Sputter Yield Correction Factor in Quantitative Auger Electron Spectroscopy—A Poor Approximation

✍ Malherbe, Johan B.; Quintin Odendaal, R. 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 239 KB 👁 1 views

Ion bombardment usually leads to a change in the equilibrium sputtered surface composition of compound semiconductors. This change is matrix dependent. To compensate for this sputter-induced e †ect in quantitative AES, a sputter yield correction factor is usually employed. This factor is based on th

Backscattering correction for quantitati

Backscattering correction for quantitative Auger analysis: III. A simple functional representation of electron backscattering factors

✍ S. Ichimura; R. Shimizu; J.P. Langeron 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 244 KB

Theoretical expressions for secondary el

Theoretical expressions for secondary electron emission from metal oxide films as a function of measurable variables

✍ K. Yassin; A. Seidman; N. Croitoru 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 299 KB

Using a superconducting tunnel junction

Using a superconducting tunnel junction detector to measure the secondary electron emission efficiency for a microchannel plate detector bombarded by large molecular ions

✍ G. Westmacott; M. Frank; S. E. Labov; W. H. Benner 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 105 KB 👁 2 views