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Using a superconducting tunnel junction detector to measure the secondary electron emission efficiency for a microchannel plate detector bombarded by large molecular ions

✍ Scribed by G. Westmacott; M. Frank; S. E. Labov; W. H. Benner


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
105 KB
Volume
14
Category
Article
ISSN
0951-4198

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