Scanning electron microscopy (SEM) has been used to study seed structure . Seeds with shrunken, cracked, or ruptured seed coats are usually short-lived . Seed shrinkage is an indication of a weak seed coat, resulting in cracks and damage which ultimately leads to loss of seed vigor or even death (Ab
โฆ LIBER โฆ
A scanning electron microscope study of Cucurbita maxima seed coat structure
โ Scribed by Lott, John N. A.
- Book ID
- 118123113
- Publisher
- NRC Research Press
- Year
- 1973
- Tongue
- English
- Weight
- 1001 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0008-4026
- DOI
- 10.1139/b73-221
No coin nor oath required. For personal study only.
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