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A rotating profile scanner for medium-sized particle beams

✍ Scribed by A.A.E. van Blokland; E.P. Barbian; Th. Oyevaar; H.W. van der Ven

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 464 KB
Volume: 312
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(92)90211-l

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