A high resolution wire scanner for micron-size profile measurements at the SLC

The potential of current high-resolution

The potential of current high-resolution imaging-based particle size distribution measurements for crystallization monitoring

✍ P. A. Larsen; J. B. Rawlings 📂 Article 📅 2009 🏛 American Institute of Chemical Engineers 🌐 English ⚖ 701 KB

## Abstract High‐speed, in situ video microscopy is a promising technology for measuring critical solid‐phase properties in suspension crystallization processes. This paper demonstrates the feasibility of high‐resolution, video‐imaging‐based particle size distribution (PSD) measurement by applying