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A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Network Analyzer (Comments)

✍ Scribed by Van Lil, E.

Book ID: 114658702
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 218 KB
Volume: 33
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.1985.1133003

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