✦ LIBER ✦

A redundancy test-time reduction technique in 1-Mbit DRAM with a multibit test mode

✍ Scribed by Nishimura, Y.; Hamada, M.; Hidaka, H.; Ozaki, H.; Fujishima, K.

No coin nor oath required. For personal study only.

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A reliable 1-Mbit DRAM with a multi-bit-

✍ Kumanoya, M.; Fujishima, K.; Miyatake, H.; Nishimura, Y.; Saito, K.; Matsukawa, 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 900 KB