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A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices

✍ Scribed by Baosheng Wang; Andy Kuo; Touraj Farahmand; André Ivanov; Yong B. Cho; Sassan Tabatabaei


Publisher
Springer US
Year
2005
Tongue
English
Weight
501 KB
Volume
21
Category
Article
ISSN
0923-8174

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