A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices

✍ Scribed by Baosheng Wang; Andy Kuo; Touraj Farahmand; André Ivanov; Yong B. Cho; Sassan Tabatabaei

• Publisher: Springer US
• Year: 2005
• Tongue: English
• Weight: 501 KB
• Volume: 21
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-005-4819-4